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SPIE Proceedings [SPIE International Conference on Optoelectronics and Microelectronics Technology and Application - Shanghai, China (Monday 10 October 2016)] International Conference on Optoelectronics and Microelectronics Technology and Application - Research of elevation error based on points cloud data of stripe principle LiDAR
Su, Yikai, Xie, Chongjin, Yu, Shaohua, Zhang, Chao, Lu, Wei, Capmany, Jose, Luo, Yi, Nakano, Yoshiaki, Hao, Yue, Yoshikawa, Akihiko, Zhuang, Songlin, Dong, Zhi-wei, Wang, Zheng-guo, Chen, Mo-ran, Fan,Volume:
10244
Year:
2017
Language:
english
DOI:
10.1117/12.2257977
File:
PDF, 558 KB
english, 2017