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Novel Silicon Drift Detector Devices for Ultra-Fast, High-Resolution X-ray Spectroscopy
Niculae, A., Bechteler, A., Eckhardt, R., Hermenau, K., Liebel, A., Lutz, G., Soltau, H., Strüder, L.Volume:
22
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927616001057
Date:
July, 2016
File:
PDF, 695 KB
english, 2016