A Bayesian approach to modeling diffraction profiles and...

Journal of Applied Crystallography 2017 / 02 Vol. 50; Iss. 1

A Bayesian approach to modeling diffraction profiles and application to ferroelectric materials

Iamsasri, Thanakorn, Guerrier, Jonathon, Esteves, Giovanni, Fancher, Chris M., Wilson, Alyson G., Smith, Ralph C., Paisley, Elizabeth A., Johnson-Wilke, Raegan, Ihlefeld, Jon F., Bassiri-Gharb, Nazani
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Volume:
50
Language:
english
Journal:
Journal of Applied Crystallography
DOI:
10.1107/S1600576716020057
Date:
February, 2017
File:
PDF, 1.50 MB
english, 2017
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