[IEEE 2016 21st IEEE European Test Symposium (ETS) -...

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[IEEE 2016 21st IEEE European Test Symposium (ETS) - Amsterdam (2016.5.23-2016.5.27)] 2016 21th IEEE European Test Symposium (ETS) - In situ measurement of aging-induced performance degradation in digital circuits

Aryan, Nasim Pour, Funke, Christian, Barsgfrede, Jens, Yilmaz, Cenk, Schmitt-Landsiedel, Doris, Georgakos, Georg
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Year:
2016
Language:
english
DOI:
10.1109/ets.2016.7519285
File:
PDF, 1.18 MB
english, 2016
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