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SPIE Proceedings [SPIE International Symposium on Optoelectronic Technology and Application 2016 - Beijing, China (Monday 9 May 2016)] Optical Measurement Technology and Instrumentation - S-F graphic representation analysis of photoelectric facula focometer poroo-plate glass
Han, Sen, Tan, JiuBin, Tong, Yilin, Han, XuecaiVolume:
10155
Year:
2016
Language:
english
DOI:
10.1117/12.2247559
File:
PDF, 429 KB
english, 2016