[ACM Press the 20th symposium - Providence, Rhode Island, USA (2010.05.16-2010.05.18)] Proceedings of the 20th symposium on Great lakes symposium on VLSI - GLSVLSI '10 - Reliability analysis of power gated SRAM under combined effects of NBTI and PBTI in nano-scale CMOS
Pushkarna, Anuj, Mahmoodi, HamidYear:
2010
Language:
english
DOI:
10.1145/1785481.1785567
File:
PDF, 648 KB
english, 2010