Inelastic X-ray scattering measurements of III–V multiple...

Applied Physics Letters 2017 / 01 Vol. 110; Iss. 4

Inelastic X-ray scattering measurements of III–V multiple quantum wells

Xia, Hongze, Patterson, Robert, Smyth, Suntrana, Feng, Yu, Chung, Simon, Zhang, Yi, Shrestha, Santosh, Huang, Shujuan, Uchiyama, Hiroshi, Tsutsui, Satoshi, Sugiyama, Masakazu, Baron, Alfred Q. R., Con
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Volume:
110
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.4974478
Date:
January, 2017
File:
PDF, 1.45 MB
english, 2017
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