[IEEE 2016 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2016.12.3-2016.12.7)] 2016 IEEE International Electron Devices Meeting (IEDM) - Towards ultimate scaling limits of phase-change memory
Xiong, F., Yalon, E., Behnam, A., Neumann, C.M., Grosse, K.L., Deshmukh, S., Pop, E.Year:
2016
Language:
english
DOI:
10.1109/IEDM.2016.7838342
File:
PDF, 435 KB
english, 2016