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[IEEE 2016 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2016.12.3-2016.12.7)] 2016 IEEE International Electron Devices Meeting (IEDM) - A 1.8e − temporal noise over 90dB dynamic range 4k2k super 35mm format seamless global shutter CMOS image sensor with multiple accumulation shutter technology
Kawabata, Kazunari, Kobayashi, Masahiro, Onuki, Yusuke, Sekine, Hiroshi, Tsuboi, Toshiki, Matsuno, Yasushi, Takahashi, Hidekazu, Inoue, Shunsuke, Ichikawa, TakeshiYear:
2016
Language:
english
DOI:
10.1109/IEDM.2016.7838377
File:
PDF, 463 KB
english, 2016