A Kinetic Model of Silicon Carbide Oxidation Based on the Interfacial Silicon and Carbon Emission Phenomenon
Hijikata, Yasuto, Yaguchi, Hiroyuki, Yoshida, SadafumiVolume:
2
Language:
english
Journal:
Applied Physics Express
DOI:
10.1143/APEX.2.021203
Date:
February, 2009
File:
PDF, 141 KB
english, 2009