[IEEE 2016 15th IEEE International Conference on Machine Learning and Applications (ICMLA) - Anaheim, CA, USA (2016.12.18-2016.12.20)] 2016 15th IEEE International Conference on Machine Learning and Applications (ICMLA) - Machine Learning for Plant Disease Incidence and Severity Measurements from Leaf Images
Mwebaze, Ernest, Owomugisha, GodliverYear:
2016
Language:
english
DOI:
10.1109/ICMLA.2016.0034
File:
PDF, 846 KB
english, 2016