SPIE Proceedings [SPIE Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies 2016 - Constanta, Romania (Thursday 25 August 2016)] Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies VIII - A new approach in the development of quality management systems for (micro)electronics
Vladescu, Marian, Tamas, Razvan, Cristea, Ionica, Bacivarov, Ioan C., Bacivarov, Angelica, Gherghina, CătălinaVolume:
10010
Year:
2016
Language:
english
DOI:
10.1117/12.2246030
File:
PDF, 415 KB
english, 2016