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Three-point bending setup for piezoresistive gauge factor measurement of thin-film samples at high temperatures
Madsen, Nis Dam, Kjelstrup-Hansen, JakobVolume:
88
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.4973512
Date:
January, 2017
File:
PDF, 4.75 MB
english, 2017