[IEEE 2016 15th IEEE International Conference on Machine...

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[IEEE 2016 15th IEEE International Conference on Machine Learning and Applications (ICMLA) - Anaheim, CA, USA (2016.12.18-2016.12.20)] 2016 15th IEEE International Conference on Machine Learning and Applications (ICMLA) - Using Temporal Discovery and Data-Driven Journey-Maps to Predict Customer Satisfaction

Bockhorst, Joe, Wang, Yingjian, Gupta, Sukrat, Qazi, Maleeha, Sun, Mingju, Fung, Glenn
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Year:
2016
Language:
english
DOI:
10.1109/ICMLA.2016.0152
File:
PDF, 326 KB
english, 2016
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