Degradation Mechanisms of Amorphous InGaZnO Thin-Film...

IEEE Transactions on Electron Devices 2017 / 1 Vol. 64; Iss. 1

Degradation Mechanisms of Amorphous InGaZnO Thin-Film Transistors Used in Foldable Displays by Dynamic Mechanical Stress

Lee, Sang Myung, Shin, Dongseok, Yun, Ilgu
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Volume:
64
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2016.2631597
Date:
January, 2017
File:
PDF, 1.90 MB
english, 2017
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