SPIE Proceedings [SPIE SPECKLE 2012: V International Conference on Speckle Metrology - Vigo, Spain (Monday 10 September 2012)] Speckle 2012: V International Conference on Speckle Metrology - Speckle reduction characterization of high power broad-area edge-emitting diodes lasers
Tran Thi, Kim Trinh, Tong, Zhaomin, Akram, Muhammad N., Doval, Ángel F., Trillo, CristinaVolume:
8413
Year:
2012
Language:
english
DOI:
10.1117/12.978228
File:
PDF, 362 KB
english, 2012