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Spectroscopic ellipsometry study of spin coated P(VDF-TrFE-CTFE) thin films and P(VDF-TrFE-CTFE)/PMMA blends
Ben-David, Moti, Engel, Leeya, Shacham-Diamand, YosiVolume:
171
Language:
english
Journal:
Microelectronic Engineering
DOI:
10.1016/j.mee.2017.01.030
Date:
March, 2017
File:
PDF, 1.85 MB
english, 2017