Mechanical strain-induced defect states in amorphous...

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Thin Solid Films 2017 / 1

Mechanical strain-induced defect states in amorphous silicon channel layers of thin-film transistors

Kim, Minsuk, Oh, Hyungon, Park, Sukhyung, Cho, Kyoungah, Kim, Sangsig
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Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2017.01.049
Date:
January, 2017
File:
PDF, 1.06 MB
english, 2017
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