Quantitative atomic resolution at interfaces: Subtraction...

Journal of Applied Physics 2017 / 01 Vol. 121; Iss. 2

Quantitative atomic resolution at interfaces: Subtraction of the background in STEM images with the example of (Ga,In)P/GaAs structures

Han, Han, Beyer, Andreas, Belz, Jürgen, König, Alexander, Stolz, Wolfgang, Volz, Kerstin
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Volume:
121
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4973587
Date:
January, 2017
File:
PDF, 5.34 MB
english, 2017
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