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[IEEE 2016 11th International Design & Test Symposium (IDT) - Hammamet, Tunisia (2016.12.18-2016.12.20)] 2016 11th International Design & Test Symposium (IDT) - Regression modeling for subset selection in rare-event statistical circuit simulation
El-Adawi, Reem, Dessouky, MohamedYear:
2016
Language:
english
DOI:
10.1109/IDT.2016.7843041
File:
PDF, 311 KB
english, 2016