Cross-sectional scanning tunneling microscopy of antiphase...

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films 2016 / 05 Vol. 34; Iss. 3

Cross-sectional scanning tunneling microscopy of antiphase boundaries in epitaxially grown GaP layers on Si(001)

Prohl, Christopher, Döscher, Henning, Kleinschmidt, Peter, Hannappel, Thomas, Lenz, Andrea
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Volume:
34
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.4945992
Date:
May, 2016
File:
PDF, 1.50 MB
english, 2016
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