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SPIE Proceedings [SPIE Electron Technology Conference ELTE 2016 - Wisla, Poland (Sunday 11 September 2016)] Electron Technology Conference 2016 - CMOS standard cells characterization for open defects for test pattern generation
Swatowska, Barbara, Maziarz, Wojciech, Pisarkiewicz, Tadeusz, Kucewicz, Wojciech, Wielgus, Andrzej, Pleskacz, WitoldVolume:
10175
Year:
2016
Language:
english
DOI:
10.1117/12.2261887
File:
PDF, 319 KB
english, 2016