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[IEEE 2016 11th International Design & Test Symposium (IDT) - Hammamet, Tunisia (2016.12.18-2016.12.20)] 2016 11th International Design & Test Symposium (IDT) - Industrial approaches for performance evaluation using on-chip monitors
Zandrahimi, Mahroo, Debaud, Philippe, Castillejo, Armand, Al-Ars, ZaidYear:
2016
Language:
english
DOI:
10.1109/IDT.2016.7843042
File:
PDF, 643 KB
english, 2016