[IEEE 2016 11th International Design & Test Symposium (IDT) - Hammamet, Tunisia (2016.12.18-2016.12.20)] 2016 11th International Design & Test Symposium (IDT) - Stress-aware analog layout devices pattern generation
El-Kenawy, Khaled, Dessouky, MohamedYear:
2016
Language:
english
DOI:
10.1109/IDT.2016.7843046
File:
PDF, 457 KB
english, 2016