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[IEEE 2016 35th International Conference of the Chilean Computer Science Society (SCCC) - Valparaíso, Chile (2016.10.10-2016.10.14)] 2016 35th International Conference of the Chilean Computer Science Society (SCCC) - Metrics and statistical techniques used to evaluate internal quality of object-oriented software: A systematic mapping
Santos, Mariana, Afonso, Paulo, Bermejo, Paulo Henrique, Costa, HeitorYear:
2016
Language:
english
DOI:
10.1109/SCCC.2016.7836021
File:
PDF, 229 KB
english, 2016