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[IEEE 2016 IEEE International Conference on Electronics, Circuits and Systems (ICECS) - Monte Carlo, Monaco (2016.12.11-2016.12.14)] 2016 IEEE International Conference on Electronics, Circuits and Systems (ICECS) - PVT variability analysis of FinFET and CMOS XOR circuits at 16nm

da Silva, Fabio G. R. G., Butzen, Paulo F., Meinhardt, Cristina
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Year:
2016
Language:
english
DOI:
10.1109/ICECS.2016.7841255
File:
PDF, 293 KB
english, 2016
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