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[IEEE 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) - Portland, OR, USA (2016.6.5-2016.6.10)] 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) - Atomic scale understanding of poly-Si/SiO2/c-Si passivated contacts: Passivation degradation due to metallization
Aguiar, Jeffery A., Young, David, Lee, Benjamin, Nemeth, William, Harvey, Steve, Aoki, Toshihiro, Al-Jassim, Mowafak, Stradins, PaulYear:
2016
Language:
english
DOI:
10.1109/pvsc.2016.7750359
File:
PDF, 1.74 MB
english, 2016