Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
2015 / 11 Vol. 33; Iss. 6
Low-energy scanning electron microscope using a monochromator with double-offset cylindrical lenses
Ogawa, Takashi, Cho, Boklae, Ahn, Sang JungVolume:
33
Language:
english
Journal:
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
DOI:
10.1116/1.4931933
Date:
November, 2015
File:
PDF, 1.73 MB
english, 2015