The surface morphology, structural properties and chemical...

Materials Science in Semiconductor Processing 2017 / 06 Vol. 63

The surface morphology, structural properties and chemical composition of Cd 1−x Zn x Te polycrystalline thick films deposited by close spaced vacuum sublimation

Znamenshchykov, Y.V., Kosyak, V.V., Opanasyuk, A.S., Dauksta, E., Ponomarov, A.A., Romanenko, A.V., Stanislavov, A.S., Medvids, A., Shpetnyi, I.O., Gorobets, Yu.I.
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Volume:
63
Language:
english
Journal:
Materials Science in Semiconductor Processing
DOI:
10.1016/j.mssp.2017.02.004
Date:
June, 2017
File:
PDF, 1.57 MB
english, 2017
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