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[IEEE 2016 Conference on Design of Circuits and Integrated Systems (DCIS) - Granada, Spain (2016.11.23-2016.11.25)] 2016 Conference on Design of Circuits and Integrated Systems (DCIS) - Using Arduino and on-chip serial-to-parallel register to test widely-programmable ADCs
Garcia-Lugo, Luis A., Becerra-Alvarez, Edwin C., Ceballos-Caceres, Joaquin, de la Rosa, Jose M.Year:
2016
Language:
english
DOI:
10.1109/DCIS.2016.7845365
File:
PDF, 14.75 MB
english, 2016