[IEEE 2016 IEEE International Conference on Electronics, Circuits and Systems (ICECS) - Monte Carlo, Monaco (2016.12.11-2016.12.14)] 2016 IEEE International Conference on Electronics, Circuits and Systems (ICECS) - Sub-electron CIS noise analysis in 65 nm process
Capoccia, Raffaele, Boukhayma, Assim, Enz, ChristianYear:
2016
Language:
english
DOI:
10.1109/ICECS.2016.7841263
File:
PDF, 205 KB
english, 2016