A new set-up of Mössbauer Spectroscopic Microscope to study the correlation between Fe impurities and lattice defects in Si crystals
Ino, Yuji, Watanabe, Tomio, Hayakawa, Kazuo, Yukihira, Kenichi, Matsumuro, Kazuaki, Fujita, Hirotaka, Ogai, Keiko, Moriguchi, Koichi, Harada, Yoshihito, Soejima, Hiroyoshi, Yoshida, YutakaLanguage:
english
Journal:
Journal of Crystal Growth
DOI:
10.1016/j.jcrysgro.2016.12.109
Date:
December, 2016
File:
PDF, 800 KB
english, 2016