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[IEEE 2016 28th International Conference on Microelectronics (ICM) - Giza, Egypt (2016.12.17-2016.12.20)] 2016 28th International Conference on Microelectronics (ICM) - Digital signature based test of analogue circuits using amplitude modulated multi-tone signals

Saleh, Mohamed S., El-Mahlawy, Mohamed H., Hassan, Hossam E. Abou-Bakr
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Year:
2016
Language:
english
DOI:
10.1109/ICM.2016.7847923
File:
PDF, 429 KB
english, 2016
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