[IEEE 2016 28th International Conference on Microelectronics (ICM) - Giza, Egypt (2016.12.17-2016.12.20)] 2016 28th International Conference on Microelectronics (ICM) - Digital signature based test of analogue circuits using amplitude modulated multi-tone signals
Saleh, Mohamed S., El-Mahlawy, Mohamed H., Hassan, Hossam E. Abou-BakrYear:
2016
Language:
english
DOI:
10.1109/ICM.2016.7847923
File:
PDF, 429 KB
english, 2016