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IEEE Transactions on Power Electronics 2017

Methodology for Wide Band-gap Device Dynamic Characterization

Zhang, Zheyu, Guo, Ben, Wang, Fei, Jones, Edward, Tolbert, Leon, Blalock, Benjamin
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Year:
2017
Language:
english
Journal:
IEEE Transactions on Power Electronics
DOI:
10.1109/TPEL.2017.2655491
File:
PDF, 1.24 MB
english, 2017
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