Multifarious applications of atomic force microscopy in forensic science investigations
Pandey, Gaurav, Tharmavaram, Maithri, Rawtani, Deepak, Kumar, Sumit, Agrawal, Y.Volume:
273
Language:
english
Journal:
Forensic Science International
DOI:
10.1016/j.forsciint.2017.01.030
Date:
April, 2017
File:
PDF, 821 KB
english, 2017