[IEEE 2016 Joint Conference of the International Workshop...

[IEEE 2016 Joint Conference of the International Workshop on Software Measurement and the International Conference on Software Process and Product Measurement (IWSM-MENSURA) - Berlin, Germany (2016.10.5-2016.10.7)] 2016 Joint Conference of the International Workshop on Software Measurement and the International Conference on Software Process and Product Measurement (IWSM-MENSURA) - Functional Size Measurement Patterns: A Proposed Approach

Trudel, Sylvie, Desharnais, Jean-Marc, Cloutier, Jimmy

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Year:

2016

Language:

english

DOI:

10.1109/IWSM-Mensura.2016.016

File:

PDF, 359 KB

english, 2016

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