Error analysis for near-field EMC problems based on...

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IEEE Transactions on Magnetics 2017

Error analysis for near-field EMC problems based on multipolar expansion approach

Li, Zhao, Tavernier, Francois, Breard, Arnaud, Krahenbuhl, Laurent, Voyer, Damien, Sartori, Carlos
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Year:
2017
Language:
english
Journal:
IEEE Transactions on Magnetics
DOI:
10.1109/TMAG.2017.2664985
File:
PDF, 3.36 MB
english, 2017
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