[IEEE 2016 74th Annual Device Research Conference (DRC) - Newark, DE, USA (2016.6.19-2016.6.22)] 2016 74th Annual Device Research Conference (DRC) - Switching mechanisms of Cu/SiC resistive memories with W and Au counter electrodes
Morgan, Katrina A., Fan, Junqing, Gowers, Robert P., Jiang, Liudi, de Groot, Cornells H.Year:
2016
Language:
english
DOI:
10.1109/drc.2016.7548455
File:
PDF, 262 KB
english, 2016