SPIE Proceedings [SPIE Eighth International Symposium on...

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SPIE Proceedings [SPIE Eighth International Symposium on Advanced Optical Manufacturing and Testing Technology (AOMATT2016) - Suzhou, China (Tuesday 26 April 2016)] 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices - Improved single image super-resolution based on edge directed interpolation

Jiang, Yadong, Kippelen, Bernard, Yu, Junsheng, Zhou, Haiyang, Yan, Ling, Zhang, Lei, Zheng, Rong, Yu, Feihong
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Volume:
9686
Year:
2016
Language:
english
DOI:
10.1117/12.2241611
File:
PDF, 791 KB
english, 2016
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