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SPIE Proceedings [SPIE Eighth International Symposium on Advanced Optical Manufacturing and Testing Technology (AOMATT2016) - Suzhou, China (Tuesday 26 April 2016)] 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics - λ/100 reference flat for commercially available Fizeau interferometer
Qian, Shinan, Idir, Mourad, Cocco, Daniele, Xiao, Tiqiao, Yamauchi, Kazuto, Kondo, Y., Bitou, Y., Yamauchi, KazuhideVolume:
9687
Year:
2016
Language:
english
DOI:
10.1117/12.2242806
File:
PDF, 670 KB
english, 2016