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Interfacial Fracture Strength of Micro-Scale Si/Cu Components with Different Free-Edge Shape
Takahashi, Yoshimasa, Kondo, Hikaru, Aihara, Kazuya, Takuma, Masanori, Saitoh, Kenichi, Arai, Shigeo, Muto, Shunsuke, Yamamoto, Yuta, Higuchi, Kimitaka, Tanaka, NobuoVolume:
665
Language:
english
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/KEM.665.169
Date:
September, 2015
File:
PDF, 679 KB
english, 2015