[IEEE 2016 IEEE MTT-S Latin America Microwave Conference (LAMC) - Puerto Vallarta, Mexico (2016.12.12-2016.12.14)] 2016 IEEE MTT-S Latin America Microwave Conference (LAMC) - Extending the usable range of the 2-port shunt through impedance measurement
Sandler, Steven M.Year:
2016
Language:
english
DOI:
10.1109/LAMC.2016.7851286
File:
PDF, 7.56 MB
english, 2016