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SPIE Proceedings [SPIE Fourth International Conference on Optical and Photonics Engineering - Chengdu, China (Monday 26 September 2016)] International Conference on Optical and Photonics Engineering (icOPEN 2016) - Comparison of sensitivity between in-situ and ex-situ detections with nanoporous TiO 2 film based plasmon waveguide resonance sensor
Asundi, Anand K., Huang, Xiyan, Xie, Yi, Wan, Xiumei, Lu, Dan-feng, Qi, Zhi-meiVolume:
10250
Year:
2017
Language:
english
DOI:
10.1117/12.2267048
File:
PDF, 754 KB
english, 2017