[IEEE 2016 International Conference on Condition Monitoring and Diagnosis (CMD) - Xi'an, China (2016.9.25-2016.9.28)] 2016 International Conference on Condition Monitoring and Diagnosis (CMD) - Multiphysics modeling and analysis of integrated optical E-field sensor for sub-nanosecond intense electromagnetic pulse measurement
Lu Wan,, Yu Chen,, Yonghong Yin,, Wei Jia,, Yiying Liu,, Yonghong Cheng,, Pignari, Sergio A.Year:
2016
Language:
english
DOI:
10.1109/CMD.2016.7757793
File:
PDF, 1.22 MB
english, 2016