Yield Forecasting Across Semiconductor Fabrication Plants...

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IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 2017

Yield Forecasting Across Semiconductor Fabrication Plants and Design Generations

Ahmadi, Ali, Stratigopoulos, Haralampos-G., Huang, Ke, Nahar, Amit, Orr, Bob, Pas, Michael, Carulli, John M., Makris, Yiorgos
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Year:
2017
Language:
english
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/TCAD.2017.2669861
File:
PDF, 1.77 MB
english, 2017
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