Topological Impurity Segregation at Faceted Silicon Grain...

Microscopy and Microanalysis 2016 / 11 Vol. 22; Iss. S5

Topological Impurity Segregation at Faceted Silicon Grain Boundaries Studied by Correlative Atomic-Resolution STEM and APT

Liebscher, CH, Stoffers, A, Cojocaru-Mirédin, O, Gault, B, Scheu, C, Dehm, G, Raabe, D
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Volume:
22
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927616012253
Date:
November, 2016
File:
PDF, 106 KB
english, 2016
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