[IEEE 2016 IEEE National Aerospace and Electronics...

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[IEEE 2016 IEEE National Aerospace and Electronics Conference (NAECON) and Ohio Innovation Summit (OIS) - Dayton, OH, USA (2016.7.25-2016.7.29)] 2016 IEEE National Aerospace and Electronics Conference (NAECON) and Ohio Innovation Summit (OIS) - Sub-surface spatial resolution of a near-field scanning microwave microscope

Estes, Nicholas, Chisum, Jonathan
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Year:
2016
Language:
english
DOI:
10.1109/NAECON.2016.7856850
File:
PDF, 438 KB
english, 2016
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