[IEEE 2016 IEEE National Aerospace and Electronics Conference (NAECON) and Ohio Innovation Summit (OIS) - Dayton, OH, USA (2016.7.25-2016.7.29)] 2016 IEEE National Aerospace and Electronics Conference (NAECON) and Ohio Innovation Summit (OIS) - Reliable and reproducible PUF based cryptographic keys under varying environmental conditions
Amsaad, Fathi, Chaudhuri, Chayanika Roy, Niamat, MohammedYear:
2016
Language:
english
DOI:
10.1109/NAECON.2016.7856851
File:
PDF, 892 KB
english, 2016