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A novel approach to deriving the lower confidence limit of indices C pu , C pl , and C pk in assessing process capability
Chen, Kuen-Suan, Wang, Kung-Jeng, Chang, Tsang-ChuanLanguage:
english
Journal:
International Journal of Production Research
DOI:
10.1080/00207543.2017.1282644
Date:
January, 2017
File:
PDF, 750 KB
english, 2017