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In situ absolute magnetometry in an UHV scanning probe microscope using conducting polymer-thin film
Ambal, Kapildeb, Williams, Clayton C., Boehme, ChristophVolume:
35
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.4973920
Date:
March, 2017
File:
PDF, 1.21 MB
english, 2017